Remove Vibration Noise from Your STM Today

For over 25 years, Herzan has been helping scanning tunneling microscope (STM) users achieve more from their research by removing disruptive vibration noise from affecting their STM. Vibration noise can cause distortions to occur in the imaging, making understanding the data collected less precise. Learn more about our proven strategies and solutions by reviewing a case study highlighting the benefits of active vibration control on surface analysis techniques for STMs.


Why Choose Herzan?

Performance/Features

Performance Comparison: AVI Series and AVI Series + LFS System. Click to Expand.
  • Active vibration isolation in all six degrees of freedom
  • Vibration isolation starting at 0.5 Hz (with the LFS System upgrade)
  • Up to 55 dB of vibration noise reduction
  • Modular and scalable design, capable of supporting industry’s largest STMs (AVI Series)
  • Simple to install solutions that do not require persistent maintenance or adjustments
Noise floor comparison for UHV-STM: Without vibration isolation, with passive vibration isolation, and with active vibration isolation.

Service/Support

  • 30-day satisfaction guarantee with full money back if unsatisfied with results
  • Free and no hassle product evaluation
  • Experienced sales and technical support to help answer any of your questionsHerzan-Product-Highlights-Image---WOSB-SwissMade-Cropped

Solutions for a Modern Age


What Our Users Are Saying

Omicron STM supported by an array of AVI-200S active vibration isolators

“(W)e first tried air legs, but these actually increased our problems with vibrational noise. I believe the reason for this is that the air legs gave the system additional freedom to move and so vibrations from stainless steel gas tube lines more effectively coupled in to our system, resulting in increased, rather and decreased noise.  I will also be reporting back to my service contact at Omicron with the success of the active vibration isolation.”

–  Professor at the University of Newcastle


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