The AVI-200 platforms help users achieve more from their research by removing disruptive low frequency vibrations from affecting their measurements. The AVI-200 platforms are field-tested solutions, leading the industry in terms of low-frequency active vibration isolation performance (starting at 0.5 Hz) for compact microscopes performing nanoscale research.
The AVI-200 platforms include a low-profile and modular design, becoming the perfect solution for users wanting an effective and easy-to-install platform to protect their high-load instruments from low-frequency vibrations.
The AVI-200 is available in three standard sizes: AVI-200S, AVI-200M, and AVI-200XL.
The AVI-200 platforms support a wide range of high-precision microscopes sensitive to low-frequency vibration noise. The most common application for the AVI-200 platforms is atomic force microscopy, supporting both end users and OEMs around the world by removing low-frequency vibration noise from important measurements.
In addition to AFMs, the AVI-200 platforms often support:
- Atomic Force Microscopy
- High Precision Metrology
- And More!
The transmissibility graph represents the vibration isolation performance of the AVI-200 Series over a frequency domain. The performance data is representative of all rotational modes of vibration (all six degrees of freedom) and should serve as a conservative estimate of performance customers can receive when pairing their instrument with an AVI-200 platform.
Performance Upgrade – LFS System
The AVI-200 Series can improve its low-frequency vibration isolation performance by pairing it with the LFS System (Low Frequency Sensor). This upgrade enables the platform to isolate vibrations starting at 0.5 Hz and can be easily retrofitted for existing systems in the field. More details on the upgraded performance can be found below.
Performance Comparison Images
Researchers operating two separate AFMs imaged different samples under two unique conditions: without a vibration isolation system and with an AVI-200S platform. The resulting images demonstrate a significant improvement in image quality and overall measurement clarity when an AVI platform is used to support an AFM.
AVI-200 Series Downloads