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EFFECTS OF NOISE ON INTERFEROMETER IMAGING
Semiconductor research and production applications involve processes which operate at extremely high levels of precision on very small scales. It is not surprising that these processes exhibit sensitivity to environmental noise. Even normal levels of building acoustic and vibration noise can frustrate these sensitive measurements. Much semiconductor testing also involves gauging the conductivity of materials, making these processes sensitive to ambient levels of electromagnetic interference (EMI). Semiconductors are also sensitive to thermal fluctuation, another potential source for error.
A quiet environment can be difficult to attain for many semiconductor applications. A great deal of research, development, and product testing takes place in a clean room, a space designed to reduce particulate contamination. Unfortunately, clean rooms incorporate air handling equipment and raised floors, which can increase ambient levels of noise due to air currents, acoustic noise, and vibrations. Semiconductor process equipment can be another source of noise, as they incorporate moving parts, pumps, and water flow.
Before installing a sensitive instrument, it is recommended to survey the site with EMI, acoustic, and vibration measurement equipment to determine the best location. To ameliorate the effect of noise, vibration isolation systems, acoustic enclosures, and EMI cancellation systems may need to be employed.
Wikipedia Article: Semiconductor Devices |
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