Herzan Helps Researchers Remove Environmental Noise from Their Measurements Through its Acoustic, Vibration, and EMI Isolation Solutions.
Acoustic, Vibration, & EMI Isolation Specialists
Active Vibration Control
Achieve Max Resolution With An Active Vibration Control System
For over 25 years, Herzan has been helping researchers achieve more from their research by removing disruptive vibration noise from affecting their instrument. Vibration noise can cause distortions to occur in imaging, making understanding data collected less precise.
Herzan active vibration control systems help attenuate noise found in imaging, whereby maximizing the quality of data collected for a wide range of instruments and applications.
Atomic Force Microscope Supported By A TS Series Table
“Simply put, our experiments would not be possible without the equipment from Herzan. It allows us to do even single-molecule experiments on the second floor of a shaky building!” – Professor Volkmar Heinrich, UC Davis
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Herzan has partnered with customers around the world to share their experiences highlighting how they were able to eliminate troublesome environmental noise and maximize the utility of their instrumentation by partnering with Herzan to define a solution.
UHV STM + AVI Series
Researchers at the School of Mathematical and Physical Sciences at Newcastle University were facing limitations in the performance of their Omicron Variable Temperature UHV-STM. They had determined that vibrations from a nearby highway were preventing them from using the instrument
Researchers at Boston University were in search of isolating mechanical noise from a custom metrology platform consisting of a MEMs accelerometer, which was re-purposed to perform a sensitive, room temperature measurement of the Casimir force.
The Zewail Group operating a Quanta FEG 650 interfaced with a custom optical set-up to enable ultrafast electron microscopy imaging. Feeding laser into SEM chamber requires positional stability within a few micrometers, so SEM internal air isolation was not in use.
The Turner Group is using interferometry to measure the deflection on an AFM probe. The instrument is being used to investigate adhesion and surface properties of nanoscale materials for MEMS applications. Despite being placed on an air-based isolation table, the instrument’s measurements
