Herzan Helps Researchers Remove Environmental Noise from Their Measurements Through its Acoustic, Vibration, and EMI Isolation Solutions.
Acoustic, Vibration, & EMI Isolation Specialists
Instrument Vibration Control
Remove Vibration Noise from Your Instrument Today
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For over 25 years, Herzan has been helping researchers achieve more from their research by removing disruptive vibration noise from affecting their instrument. Vibration noise can cause distortions to occur in the imaging, making understanding the data collected less precise. Learn more about our proven strategies and solutions by downloading our latest whitepaper.
Atomic Force Microscope Supported By A TS Series Table
“Simply put, our experiments would not be possible without the equipment from Herzan. It allows us to do even single-molecule experiments on the second floor of a shaky building!” – Professor Volkmar Heinrich, UC Davis
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Herzan has partnered with customers around the world to share their experiences highlighting how they were able to eliminate troublesome environmental noise and maximize the utility of their instrumentation by partnering with Herzan to define a solution.
Bio Applications + TS Series
The Heinrich Lab built a custom force probe to investigate the adhesive properties and other mechanical characteristics of biomolecules to further their cutting-edge bioengineering research. They soon found that environmental noise was limiting the
Fertility Research Associates needed an isolation system to reduce the environmental vibrations affecting their intracytoplasmic sperm injection (ICSI) process. They chose the TS system based on the recommendation of a colleague who had previous experience. The TS immediately
The Zewail Group operating a Quanta FEG 650 interfaced with a custom optical set-up to enable ultrafast electron microscopy imaging. Feeding laser into SEM chamber requires positional stability within a few micrometers, so SEM internal air isolation was not in use. Vibration levels
The Turner Group is using interferometry to measure the deflection on an AFM probe. The instrument is being used to investigate adhesion and surface properties of nanoscale materials for MEMS applications. Despite being placed on an air-based isolation table, the instrument’s measurements
