This exclusive quarterly newsletter highlights the latest product announcements, application specific solutions, and news about the company. Take a look inside the latest developments at Herzan and see if these new developments can complement your research!

Stop By Our Booth! MRS Fall Meeting 2018

It’s that time of year where researchers come together to share the latest advancements in the field of materials science. We at Herzan are excited to join them and share how our environmental control solutions can help them acheive more from their research by removing disruptive noise from their measurements.

As is tradition, the MRS Fall Meeting will be held in the Hynes Convention Center in Boston, Massachusetts. Attendees can stop by our booth (Booth 809), where we will be sharing our latest environmental control solutions for researchers using SEMs/TEMs, AFMs/SPMs, STMs, and more.

Featured at The Booth

  • The AVI Series: Herzan’s dynamic active vibration control platform engineered to support microscopes of all shapes and sizes
  • The Spicer System: industry leading AC/DC field cancellation for SEMs/TEMs
  • The WaveCatcher: Herzan’s accurate and affordable site survey tool

Also, there will be some free giveaways at the booth to bring home to family and friends or share with colleagues in the lab!

Fall Savings Promotion Is Here!

Herzan is excited to announce it’s Fall Savings Program! This program allows researchers to save big on Herzan’s most popular products (up to 30%), available to new and existing customers for some our most popular products.  Don’t wait, these promotions are available until 12/31/2018. 

Featured Case Study

Users at the Zewail Group (California Institute of Technology) had significant vibration noise interrupting their FEI Quanta 650 FEG SEM. After installing the AVI-400M platform, they shared the following:

“We feel quite positive about the performance of the AVI. The anti-vibration system much reduces the vibration seen in the images, and at the same time maintains vertical stability of the laser interaction with the emitter tip.”

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