Experts In Environmental Control: Active Vibration Control Platforms, Acoustic Enclosures, and Magnetic Field Cancellation Systems
Experts In Environmental Control
Active Vibration Attenuation
Achieve Max Resolution With An Active Vibration Attenuation System
For over 25 years, Herzan has been helping researchers achieve more from their research by removing disruptive vibration noise from affecting their instrument. Vibration noise can cause distortions to occur in imaging, making understanding data collected less precise.
Herzan active vibration attenuation systems help attenuate noise found in imaging, whereby maximizing the quality of data collected for a wide range of instruments and applications.
Atomic Force Microscope Supported By A TS Series Table
“Simply put, our experiments would not be possible without the equipment from Herzan. It allows us to do even single-molecule experiments on the second floor of a shaky building!” – Professor Volkmar Heinrich, UC Davis
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Herzan has partnered with customers around the world to share their experiences highlighting how they were able to eliminate troublesome environmental noise and maximize the utility of their instrumentation by partnering with Herzan to define a solution.
Measuring Casimir Force + TS Series
Researchers at Boston University were in search of isolating mechanical noise from a custom metrology platform consisting of a MEMs accelerometer, which was re-purposed to perform a sensitive, room temperature measurement of the Casimir force.
Researchers at Essilor USA observed a substantial amount of vibration noise limiting their Keyence VK-X250 3D Laser Scanning Confocal Microscope. The resulting vibration noise affected their surface roughness measurements, resulting in inaccurate results. To combat these issues, Essilor worked with Herzan to discover the best solution for their instrument given the severity of their environment: the TS-140 active vibration isolation table.
The Nano-Bio Lab at the University of Texas at Dallas saw vibration noise not being isolated by their optical table. As a result, they turned to the TS-150 vibration isolation table as a solution to help remove the low-frequency vibration noise from limiting their research.
The Turner Group is using interferometry to measure the deflection on an AFM probe. The instrument is being used to investigate adhesion and surface properties of nanoscale materials for MEMS applications. Despite being placed on an air-based isolation table, the instrument’s measurements
