Herzan Helps Researchers Remove Environmental Noise from Their Measurements Through its Acoustic, Vibration, and EMI Isolation Solutions.
Acoustic, Vibration, & EMI Isolation Specialists
SPM Vibration Control
Remove Vibration Noise from Your SPM Today
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For over 25 years, Herzan has been helping scanning probe microscope (SPM) users achieve more from their research by removing disruptive vibration noise from affecting their SPM. Vibration noise can cause distortions to occur in the imaging, making understanding the data collected less precise. Learn more about our proven strategies and solutions by downloading our latest Solutions Guide.
BIO AFM Supported by A TS Series Active Vibration Isolation Table
“Simply put, our experiments would not be possible without the equipment from Herzan. It allows us to do even single-molecule experiments on the second floor of a shaky building!” – Professor Volkmar Heinrich, UC Davis
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Herzan has partnered with customers around the world to share their experiences highlighting how they were able to eliminate troublesome environmental noise and maximize the utility of their instrumentation by partnering with Herzan to define a solution.
SICM + AVI Series
There are three instrumentation setups in the Baker Group that make use of the AVI-200 active vibration isolation system. Our studies are mainly focused on scanned probe microscopy, where is a nanopipette filled with electrolyte is used to either map the local ion current of a given sample or to obtain a
Fertility Research Associates needed an isolation system to reduce the environmental vibrations affecting their intracytoplasmic sperm injection (ICSI) process. They chose the TS system based on the recommendation of a colleague who had previous experience. The TS immediately
The Heinrich Lab built a custom force probe to investigate the adhesive properties and other mechanical characteristics of biomolecules to further their cutting-edge bioengineering research. They soon found that environmental noise was limiting the
The Turner Group is using interferometry to measure the deflection on an AFM probe. The instrument is being used to investigate adhesion and surface properties of nanoscale materials for MEMS applications. Despite being placed on an air-based isolation table, the instrument’s measurements
