Experts In Environmental Control: Active Vibration Control Platforms, Acoustic Enclosures, and Magnetic Field Cancellation Systems
Experts In Environmental Control
SPM Vibration Control
Remove Vibration Noise from Your SPM Today
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For over 25 years, Herzan has been helping scanning probe microscope (SPM) users achieve more from their research by removing disruptive vibration noise from affecting their SPM. Vibration noise can cause distortions to occur in the imaging, making understanding the data collected less precise. Learn more about our proven strategies and solutions by downloading our latest Solutions Guide.
BIO AFM Supported by A TS Series Active Vibration Isolation Table
“Simply put, our experiments would not be possible without the equipment from Herzan. It allows us to do even single-molecule experiments on the second floor of a shaky building!” – Professor Volkmar Heinrich, UC Davis
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Herzan has partnered with customers around the world to share their experiences highlighting how they were able to eliminate troublesome environmental noise and maximize the utility of their instrumentation by partnering with Herzan to define a solution.
MEMS + TS Series
The Turner Group is using interferometry to measure the deflection on an AFM probe. The instrument is being used to investigate adhesion and surface properties of nanoscale materials for MEMS applications. Despite being placed on an air-based isolation table, the instrument’s measurements
Researchers at the School of Mathematical and Physical Sciences at Newcastle University were facing limitations in the performance of their Omicron Variable Temperature UHV-STM. They had determined that vibrations from a nearby highway were preventing them from using the instrument
The Nano-Bio Lab at the University of Texas at Dallas saw vibration noise not being isolated by their optical table. As a result, they turned to the TS-150 vibration isolation table as a solution to help remove the low-frequency vibration noise from limiting their research.
The Zewail Group operating a Quanta FEG 650 interfaced with a custom optical set-up to enable ultrafast electron microscopy imaging. Feeding laser into SEM chamber requires positional stability within a few micrometers, so SEM internal air isolation was not in use.
