Herzan Helps Researchers Remove Environmental Noise from Their Measurements Through its Acoustic, Vibration, and EMI Isolation Solutions.
Acoustic, Vibration, & EMI Isolation Specialists
SPM Vibration Control
Remove Vibration Noise from Your SPM Today
Download Solutions Guide
For over 25 years, Herzan has been helping scanning probe microscope (SPM) users achieve more from their research by removing disruptive vibration noise from affecting their SPM. Vibration noise can cause distortions to occur in the imaging, making understanding the data collected less precise. Learn more about our proven strategies and solutions by downloading our latest Solutions Guide.
BIO AFM Supported by A TS Series Active Vibration Isolation Table
“Simply put, our experiments would not be possible without the equipment from Herzan. It allows us to do even single-molecule experiments on the second floor of a shaky building!” – Professor Volkmar Heinrich, UC Davis
Trusted By Instrument Makers and Their Users
*All logos and trademarks are property of their respective owners
Herzan has partnered with customers around the world to share their experiences highlighting how they were able to eliminate troublesome environmental noise and maximize the utility of their instrumentation by partnering with Herzan to define a solution.
Electrophysiology + TS Series
A consortium of researchers aimed to understand binocular encoding within the Damselfly Pre-motor Target Tracking Systems. Paloma Bellido of the University of Minnesota worked with Herzan to remove vibration noise from the electrophysiology testing setup created. Ultimately, the testing setup helped record intracellularly from neurons in damselflies.
The Heinrich Lab built a custom force probe to investigate the adhesive properties and other mechanical characteristics of biomolecules to further their cutting-edge bioengineering research. They soon found that environmental noise was limiting the
Researchers at the School of Mathematical and Physical Sciences at Newcastle University were facing limitations in the performance of their Omicron Variable Temperature UHV-STM. They had determined that vibrations from a nearby highway were preventing them from using the instrument
The Turner Group is using interferometry to measure the deflection on an AFM probe. The instrument is being used to investigate adhesion and surface properties of nanoscale materials for MEMS applications. Despite being placed on an air-based isolation table, the instrument’s measurements
