Herzan Helps Researchers Remove Environmental Noise from Their Measurements Through its Acoustic, Vibration, and EMI Isolation Solutions.
Experts In Environmental Control
AFM Vibration Control
Remove Vibration Noise from Your AFM Today
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For over 25 years, Herzan has been helping atomic force microscope (AFM) users achieve more from their research by removing disruptive vibration noise from affecting their AFM. Vibration noise can cause distortions to occur in the imaging, making understanding the data collected less precise. Learn more about our proven strategies and solutions by downloading our latest Solutions Guide.
BIO AFM Supported by A TS Series Active Vibration Isolation Table
“Simply put, our experiments would not be possible without the equipment from Herzan. It allows us to do even single-molecule experiments on the second floor of a shaky building!” – Professor Volkmar Heinrich, UC Davis
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Herzan has partnered with customers around the world to share their experiences highlighting how they were able to eliminate troublesome environmental noise and maximize the utility of their instrumentation by partnering with Herzan to define a solution.
Electrophysiology + TS Series
A consortium of researchers aimed to understand binocular encoding within the Damselfly Pre-motor Target Tracking Systems. Paloma Bellido of the University of Minnesota worked with Herzan to remove vibration noise from the electrophysiology testing setup created. Ultimately, the testing setup helped record intracellularly from neurons in damselflies.
Researchers at Essilor USA observed a substantial amount of vibration noise limiting their Keyence VK-X250 3D Laser Scanning Confocal Microscope. The resulting vibration noise affected their surface roughness measurements, resulting in inaccurate results. To combat these issues, Essilor worked with Herzan to discover the best solution for their instrument given the severity of their environment: the TS-140 active vibration isolation table.
The Turner Group is using interferometry to measure the deflection on an AFM probe. The instrument is being used to investigate adhesion and surface properties of nanoscale materials for MEMS applications. Despite being placed on an air-based isolation table, the instrument’s measurements
The Zewail Group operating a Quanta FEG 650 interfaced with a custom optical set-up to enable ultrafast electron microscopy imaging. Feeding laser into SEM chamber requires positional stability within a few micrometers, so SEM internal air isolation was not in use.
