Herzan Helps Researchers Remove Environmental Noise from Their Measurements Through its Acoustic, Vibration, and EMI Isolation Solutions.
Acoustic, Vibration, & EMI Isolation Specialists
AFM Vibration Control
Remove Vibration Noise from Your AFM Today
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For over 25 years, Herzan has been helping atomic force microscope (AFM) users achieve more from their research by removing disruptive vibration noise from affecting their AFM. Vibration noise can cause distortions to occur in the imaging, making understanding the data collected less precise. Learn more about our proven strategies and solutions by downloading our latest Solutions Guide.
BIO AFM Supported by A TS Series Active Vibration Isolation Table
“Simply put, our experiments would not be possible without the equipment from Herzan. It allows us to do even single-molecule experiments on the second floor of a shaky building!” – Professor Volkmar Heinrich, UC Davis
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Herzan has partnered with customers around the world to share their experiences highlighting how they were able to eliminate troublesome environmental noise and maximize the utility of their instrumentation by partnering with Herzan to define a solution.
Bio Applications + TS Series
The Heinrich Lab built a custom force probe to investigate the adhesive properties and other mechanical characteristics of biomolecules to further their cutting-edge bioengineering research. They soon found that environmental noise was limiting the
Researchers at Essilor USA observed a substantial amount of vibration noise limiting their Keyence VK-X250 3D Laser Scanning Confocal Microscope. The resulting vibration noise affected their surface roughness measurements, resulting in inaccurate results. To combat these issues, Essilor worked with Herzan to discover the best solution for their instrument given the severity of their environment: the TS-140 active vibration isolation table.
The Nano-Bio Lab at the University of Texas at Dallas saw vibration noise not being isolated by their optical table. As a result, they turned to the TS-150 vibration isolation table as a solution to help remove the low-frequency vibration noise from limiting their research.
The Turner Group is using interferometry to measure the deflection on an AFM probe. The instrument is being used to investigate adhesion and surface properties of nanoscale materials for MEMS applications. Despite being placed on an air-based isolation table, the instrument’s measurements
